Indian Institute of Public Administration

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Long-memory modelling and forecasting of the returns and volatility of Exchange-Traded Notes (ETNs)

By: Masa, Argel S.
Contributor(s): Diaz, John Francis T.
Material type: materialTypeLabelArticlePublisher: 2017Description: p.23-53.Subject(s): Exchange rates In: Margin
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Articles Articles Indian Institute of Public Administration
Volume no: 11, Issue no: 1 Available AR114746

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