Indian Institute of Public Administration

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Measuring economic downside risk and severity: growth at risk by Yan Wan and Yudong Yao

By: Yan Wang.
Contributor(s): Yudong Yao.
Material type: materialTypeLabelBookSeries: Policy research working paper 2674. Publisher: Washington, D.C. World Bank 2001Description: 30p.Subject(s): Risk management | Risk | Business cycles | Economic development
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WB WB Indian Institute of Public Administration
Available WB9097

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